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Advanced Semiconductor Identification Solutions

Precision technologies for wafer identification, RFID tracking, and complete semiconductor traceability.

Batch Wafer Reader

High-speed, full-cassette wafer ID reading solution.

Key Features:

  • Front & back wafer ID reading
  • Processes 25 wafers in ~35 seconds
  • SEMI-standard user interface
  • Integrated IOSS WID120 wafer ID reader
  • Automatic RGB illumination
  • Reliable under various wafer conditions
  • Cleanroom-ready compact design

IOSS WID 120 Wafer ID Reader

Industry-leading wafer identification system.

Key Features:

  • Up to 18 adaptive RGB illumination modes
  • Automatic exposure control
  • Decodes OCR, Barcode, DataMatrix, QR-code
  • Intuitive GUI with teach-in wizard
  • Stable performance on multiple wafer materials
  • Seamless OEM & equipment integration
  • High-quality image processing for accurate traceability

RFID Reader XEDION

Semiconductor-grade RFID detection for next-gen traceability.

Key Features:

  • High-reliability RFID detection
  • Full transparency & secure production tracking
  • Stable read performance across tag types
  • Designed for wafer-level & microchip applications
  • Cleanroom and industrial-ready
  • Easy integration with automation systems